CCCII circuit performance estimation under PVT variation ageing and radiation effects

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dc.contributor.authorTiwari, Manoj Kumar
dc.date.accessioned2022-12-16T07:06:54Z
dc.date.available2022-12-16T07:06:54Z
dc.date.issued2022-11
dc.identifier.urihttp://hdl.handle.net/123456789/2612
dc.language.isoenen_US
dc.publisherIndian Institute of Technology (Indian School of Mines) Dhanbaden_US
dc.subjectCCCII circuitsen_US
dc.subjectCMOS technologyen_US
dc.subjectanalog circuitsen_US
dc.subjectDO-RTCCCIIen_US
dc.subjectPh.Den_US
dc.subjectEEen_US
dc.subjectPH2310en_US
dc.titleCCCII circuit performance estimation under PVT variation ageing and radiation effectsen_US
dc.typeThesisen_US
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