Open switch fault identification in diode clamped MLI using artificial neural network

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dc.contributor.authorKumar, Balmiki
dc.date.accessioned2024-05-22T10:32:20Z
dc.date.available2024-05-22T10:32:20Z
dc.date.issued2024-05
dc.identifier.urihttp://hdl.handle.net/123456789/3096
dc.language.isoenen_US
dc.publisherIndian Institute of Technology (Indian School of Mines) Dhanbaden_US
dc.subjectMulti level Inverteren_US
dc.subjectShort circuit faulten_US
dc.subjectOpen circuit faulten_US
dc.subjectPattern recognition neural networken_US
dc.subjectDISTen_US
dc.subjectDS963en_US
dc.subjectEEen_US
dc.titleOpen switch fault identification in diode clamped MLI using artificial neural networken_US
dc.typeThesisen_US
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