X-ray photoelectron spectroscopy study of V2O5 dispersion on a nanosized Al2O3-TiO2 mixed oxide
dc.contributor.author | Reddy, Benjaram M...[ et al.] | |
dc.date.accessioned | 2018-06-19T10:06:16Z | |
dc.date.available | 2018-06-19T10:06:16Z | |
dc.date.issued | 2001 | |
dc.identifier.citation | Langmuir, 2001, V.17, P.1132-1137 | en_US |
dc.identifier.other | 10.1021/la000920v | |
dc.identifier.uri | http://hdl.handle.net/123456789/1271 | |
dc.language.iso | en | en_US |
dc.publisher | American Chemical Society | en_US |
dc.subject | Al2O3-TiO2 | en_US |
dc.subject | Selective catalytic reduction | en_US |
dc.subject | X-ray photoelectron spectroscopy | en_US |
dc.subject | FT-infrared | en_US |
dc.subject | SCIE | en_US |
dc.title | X-ray photoelectron spectroscopy study of V2O5 dispersion on a nanosized Al2O3-TiO2 mixed oxide | en_US |
dc.type | Article | en_US |