Evolutionary algorithms for test generation of digital circuits

Thumbnail Image
Files
Abstract.pdf (292.13 KB)
DS1393.pdf (4.96 MB)
Date
2024-05
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Indian Institute of Technology (Indian School of Mines) Dhanbad
Abstract
Description
Keywords
Differential Evolution DE, MATLAB presentation, Sequential benchmark circuits, DIST, DS1393, ECE
Citation
URI
http://hdl.handle.net/123456789/3781
Collections
Rahul Bhattacharya