Joshipura, K. N...[ et al.]2018-06-202018-06-202003European Physical Journal D,2003,V.23,P.81–90DOI: 10.1140/epjd/e2003-00009-9http://hdl.handle.net/123456789/1283enTotal ionization cross-sections (TICS)CSP-ic methodsCCl4SCIETheoretical total ionization cross-sections of CHx, CFx, SiHx , SiFx (x = 1−4) and CCl4 targets by electron impactArticle