Phase transition induced double-Gaussian barrier height distribution in Schottky diode
| dc.contributor.author | Bobby, A...[ et al.] | |
| dc.date.accessioned | 2018-06-20T11:25:12Z | |
| dc.date.available | 2018-06-20T11:25:12Z | |
| dc.date.issued | 2013 | |
| dc.identifier.citation | Physica B,2013,V.431,P.6-10 | en_US |
| dc.identifier.other | http://dx.doi.org/10.1016/j.physb.2013.08.037 | |
| dc.identifier.uri | http://hdl.handle.net/123456789/1295 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier | en_US |
| dc.subject | Hg–nSi Schottkycontacts | en_US |
| dc.subject | Interfacial conduction mechanism | en_US |
| dc.subject | Inhomogeneity | en_US |
| dc.subject | SCIE | en_US |
| dc.title | Phase transition induced double-Gaussian barrier height distribution in Schottky diode | en_US |
| dc.type | Article | en_US |