The role of electronic energy loss in SHI irradiated Ni/oxide/n-GaP Schottky diode
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Date
2017
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
Description
Keywords
Gallium Phosphide, Schottky contacts, SHI irradiation, Dielectric properties, Space charge polarization, Electronic energy loss, Negative capacitance, SCIE
Citation
Microelectronics Reliability,2017,V.69,P.40–46