Computational techniques and performance evaluation of nanoscale strained mosfets and related CMOS circuits

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Date
2017-03
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Indian Institute of Technology (Indian School of Mines), Dhanbad
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Description
Keywords
Channel effects, Biaxial strain, Dual channel biaxial strained, MOSFET based CMOS inverter, Threshold voltage, ECE, Ph.D
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http://hdl.handle.net/123456789/879
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Subindu Kumar