Computational techniques and performance evaluation of nanoscale strained mosfets and related CMOS circuits

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dc.contributor.authorKumari, Amrita
dc.date.accessioned2017-11-22T05:06:54Z
dc.date.available2017-11-22T05:06:54Z
dc.date.issued2017-03
dc.identifier.urihttp://hdl.handle.net/123456789/879
dc.language.isoenen_US
dc.publisherIndian Institute of Technology (Indian School of Mines), Dhanbaden_US
dc.subjectChannel effectsen_US
dc.subjectBiaxial strainen_US
dc.subjectDual channel biaxial straineden_US
dc.subjectMOSFET based CMOS inverteren_US
dc.subjectThreshold voltageen_US
dc.subjectECEen_US
dc.subjectPh.Den_US
dc.titleComputational techniques and performance evaluation of nanoscale strained mosfets and related CMOS circuitsen_US
dc.typeThesisen_US
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