Theoretical total ionization cross-sections of CHx, CFx, SiHx , SiFx (x = 1−4) and CCl4 targets by electron impact
Loading...
Date
2003
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Springer
Abstract
Description
Keywords
Total ionization cross-sections (TICS), CSP-ic methods, CCl4, SCIE
Citation
European Physical Journal D,2003,V.23,P.81–90