Theoretical total ionization cross-sections of CHx, CFx, SiHx , SiFx (x = 1−4) and CCl4 targets by electron impact
| dc.contributor.author | Joshipura, K. N...[ et al.] | |
| dc.date.accessioned | 2018-06-20T06:00:14Z | |
| dc.date.available | 2018-06-20T06:00:14Z | |
| dc.date.issued | 2003 | |
| dc.identifier.citation | European Physical Journal D,2003,V.23,P.81–90 | en_US |
| dc.identifier.other | DOI: 10.1140/epjd/e2003-00009-9 | |
| dc.identifier.uri | http://hdl.handle.net/123456789/1283 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer | en_US |
| dc.subject | Total ionization cross-sections (TICS) | en_US |
| dc.subject | CSP-ic methods | en_US |
| dc.subject | CCl4 | en_US |
| dc.subject | SCIE | en_US |
| dc.title | Theoretical total ionization cross-sections of CHx, CFx, SiHx , SiFx (x = 1−4) and CCl4 targets by electron impact | en_US |
| dc.type | Article | en_US |