Reverse leakage mechanisms of liquid metal contacts onto II–VI group semiconductor (Ga/p-WSe2)

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EPJ-AP-62-2013.pdf (675.27 KB)
Date
2013
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Publisher
EDP Sciences
Abstract
Description
Keywords
Schottky diodes, Current-voltage method, Semiconductor (Ga/p-WSe2), Current-voltage method, SCIE
Citation
European Physical Journal-Applied Physics,2013,V.62,P.20104-1-5
URI
http://hdl.handle.net/123456789/1303
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Bobby Antony