Reverse leakage mechanisms of liquid metal contacts onto II–VI group semiconductor (Ga/p-WSe2)
dc.contributor.author | Bobby, Achamma | |
dc.contributor.author | Gupta, Partha Sarathi | |
dc.contributor.author | Antony, Bobby Kachappilly | |
dc.date.accessioned | 2018-06-21T06:23:26Z | |
dc.date.available | 2018-06-21T06:23:26Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | European Physical Journal-Applied Physics,2013,V.62,P.20104-1-5 | en_US |
dc.identifier.other | DOI: 10.1051/epjap/2013130018 | |
dc.identifier.uri | http://hdl.handle.net/123456789/1303 | |
dc.language.iso | en | en_US |
dc.publisher | EDP Sciences | en_US |
dc.subject | Schottky diodes | en_US |
dc.subject | Current-voltage method | en_US |
dc.subject | Semiconductor (Ga/p-WSe2) | en_US |
dc.subject | Current-voltage method | en_US |
dc.subject | SCIE | en_US |
dc.title | Reverse leakage mechanisms of liquid metal contacts onto II–VI group semiconductor (Ga/p-WSe2) | en_US |
dc.type | Article | en_US |